JEOL JMS-T2000GC AccuTOF GC-Alpha
JEOL JMS-T2000GC AccuTOF GC-Alpha
The JMS-T2000GC (AccuTOF GC-Alpha) is a fully automated, high resolution GC/MS system. By extending the flight path to 4 meters, the resolution has been increased to 30,000. Besides the electron ionization (EI) ion source, which is provided as standard, a wide variety of additional ion sources are optionally available, for instance:
• Field emission and field desorption sources (EI/FI/FD)
• Photoionization (PI/EI)
• Chemical ionization (CI)
The use of soft ionization techniques (such as PI or FI) enables the identification of molecular ions, which allows for a fast identification of the molecular structure. All ionization sources can be changed without breaking the vacuum. Besides using gas chromatography, the samples can also be introduced using a direct inlet (direct exposure probe DEP, direct insertion probe DIP). This allows for a qualitative and quantitative analysis of liquid or solid samples.
With the design of the mass analyzer being based on a reflectron TOF-MS, not only quantitative and qualitative analyses but also highly accurate mass measurements can be performed at ease. The user-friendly setup of the JMS-T2000GC enables the efficient acquisition of highly reliable and high-quality data.
Specifications
Equipment type | TOF mass spectrometer |
Mass accuracy | ≤ 1 ppm (with internal standard) |
Mass Resolution | R ≥ 30,000 (FWHM) |
Sensitivity | S/N ≥ 300 for 1pg OFN |
Data recording speed | Up to 50 spectra/s |
Mass range | 4-6,000 u |
Ionization modes | EI, CI, FI, PI, FD, DIP, DEP, FD |
Sample inlets | GC, DEP, DIP, FD probe |
Please note:
Subject to technical changes; errors excepted. All brand names that appear in the text are registered trademarks of the manufacturers.