Range of application

The resolution of conventional optical microscopes and x-ray tomography systems is insufficient to understand the structural information of biological samples on a micro- and nanoscale. With JEOL electron microscopes it is possible to image and three-dimensionally reconstruct not only the smallest of biological structures such as viruses, but also microscale objects such as synapses or cells.

Reconstruction of a bacteriophage (left) and synapses (right)

Source data: Journal of Structural Biology 177 (2012) 589–601 and JEOL News 51

Abrasives contain particles of very hard, ceramic grains. Mechanically stripping the material structure to evaluate the corn and pore distribution is therefore very challenging. JEOL systems enable the simple, artifact-free production of large-scale cross-sections for examination.

Cross-section through an abrasive material with boron nitride grains

Source data: JEOL (Germany) GmbH, Diamant-Gesellschaft Tesch GmbH, data authorised for publication

Modern paintwork is usually performed as a multi-layer system. In the case of macroscopically visible paint defects, it is very important to be able to determine the layer in which the cause of the defect lies. Our systems make it easy to examine the cross-section of the layers of paint.

Cross-section of a painted metal surface. The diameter of the inclusion is approx. 10 µm.

Source data: JEOL Ltd. / CP brochure

As a mass-produced product, it is possible to manufacture paper cost effectively if the ratio of fibres and filler material is optimised without the changing the mechanical and printing properties. In this respect it is important to examine the distribution of fibre and filler material in the paper both during the paper development and production. The exceptionally robust analytic systems from JEOL can be used during challenging routine operation for artifact-free preparation, as well as for the precise morphological and chemical characterisation of cellulose.

Facing cut through a sheet of paper

Source data: JEOL (Germany) GmbH

Inorganic base materials form the basis of a number of important industrial intermediate and end products (e.g. plastics, dyes, fertilisers). These basic materials therefore already have to fulfil certain quality criteria. The powerful systems from JEOL enable the structural characterisation of such chemicals and thus make unequivocal statements regarding their composition and purity.

²⁷Al solid NMR spectrum of an inorganic compound with octrahedally (right) and tetrahedally (left) coordinated aluminium species

Source data: JEOL Ltd. / Solid State NMR brochure, page 2 (text portions deleted)

Asbestos was used for decades as a fire- and temperature-proof raw and insulation material. Once the health risks were discovered, many laboratories examined potentially asbestos-containing construction materials. JEOL is the only manufacturer to offer the powerful combination of its own electron microscopes and own spectrometers as a complete solution for standards-compliant asbestos analysis.

Identification of a chrysotile fibre by means of SEM imaging and EDX spectrum

Bildquelle: JED-Broschüre

The surface of lotus leaves can serve as a model for self-cleaning surfaces. The exact characterisation of these surfaces is vital in order to be able to recreate them. The surface of lotus leaves comprises small wax tubes that can be easily destroyed during examination with an electron beam. JEOL therefore offers tailor-made solutions that thermally stabilise the samples in a controlled manner and thus prevent them from being destroyed by the observation.

Surface of a lotus petal. The wax tubes have a diameter of approx. 50 nm

Source data: JEOL (Germany) GmbH

Specific preparation methods must be used for the high-resolution imaging and analysis of biological samples in an electron microscope. Food stuffs and their constituents in particular can only be imaged artifact-free through active cooling. JEOL electron microscopes are therefore prepared as standard for the installation of cryogenic systems so that sensitive samples can be prepared externally, transferred in a cooled state and subsequently examined in a cryogenic mode of operation.

Electron microscope image of powdered milk

Source data: JEOL (Germany) GmbH, DIL Quakenbrück

Modern paintwork is usually a multi-layer system. In the case of macroscopically visible paint defects, it is very important to be able to determine the layer in which the cause of the defect lies. JEOL preparation systems enable the simple and reproducible production of artifact-free cross-sections.

Cross-section of a painted metal surface. The diameter of the inclusion is approx. 10 µm.

Source data: JEOL Ltd., CP brochure

Li batteries are used in mobile phones or vehicles, among other things. Thanks to the newly developed light element spectrometer from JEOL, detecting in a microscope has for the first time become routine and standard with high spatial resolution and detection sensitivity.

Identification of lithium in an Li-ion battery

Source data: JEOL Ltd., SXES brochure

Metal powders are used for producing metal ceramics, among other things, with the density and structure of the powder playing an important role. With JEOL microscopes it is possible to image the structure and material composition down to the last detail. JEOL supplies an established and powerful complete solution for simple, artifact-free preparation and high-resolution imaging and analytics.

SEM image of a metallic powder

Source: JEOL (Germany) GmbH

The formation of precipitates is used systematically to define the mechanical properties of a metallic structure. However, as a form of contamination, these can also be undesired. In order to be able to judge the quality of an alloy, it is necessary to determine the morphology and chemical composition of the precipitates. This is why JEOL supplies all-round, complete solutions, from artifact-free sample preparation to high-resolution analysis from the µm to the nm level.

Element mapping image of a brass alloy

Source data: JEOL (Germany) GmbH

Fibres are used in many branches of industry, e.g. in textile processing or as a structural material in mechanical engineering. Their structural properties can be studied by means of a fibre cross-section, for example. JEOL supplies an established and powerful complete solution for simple, artifact-free preparation and high-resolution imaging and analytics.

SEM image of a cross-section through a fibre bundle

Source data: JEOL Ltd., Ion Slicer brochure

In industrial quality inspection, the simple and quick characterisation of a workpiece is of vital importance. Thanks to their high resolution, powerful element analysis and, above all, their unique depth of detail, scanning electron microscopes are increasingly being used for this purpose. All JEOL systems have a special lens that ensures distortion-free, detailed imaging of macroscopic components.

Electron microscope image of a 33-mm long screw

Source data: JEOL (Germany) GmbH

To achieve the high-resolution imaging and analytics of biological samples, it is often necessary to examine the sample in its native state. Thanks to the patented JEOL Aqua Cover, it is even possible to image moist or hydrated samples in a scanning electron microscope at low pressure.

Image of a water droplet on the surface of a rose petal

Source data: JEOL Ltd. (Aqua Cover presentation)

During the course of evolution, living organisms have developed a multitude of microscopic surface structures to be able to e.g. move forward over smooth surfaces like a gecko, or on water like a water strider. To characterise these structures faithfully, JEOL supplies fully integrated solutions for artifact-free preparation and high-resolution imaging.

SEM image of the femur of an arthropod.

Image source: JEOL (Germany) GmbH, applied research paper for TUM Weihenstephan, Zoology Department

During operation, materials are frequently exposed to high thermal loads, which change the microstructure or chemical composition of the material. In order to be able to examine this change in a scanning electron microscope, JEOL equips its EDX detectors with the option of recording the change over time. It is therefore possible to observe in-situ e.g. the grain growth and chemical separation caused by an external heat input.

Thermally induced change to soldering tin (Pb Sn)

Source: JEOL Ltd.

Minerals are frequently complex structures formed from a multitude of elements. Element mapping images are one of the most important methods for achieving the spatially resolved visualisation of the chemical composition. These mapping images can be used to gather essential information on e.g. the creation and structure of the samples under examination. For this task, JEOL supplies the most stable and most energetically and spatially high-resolution spectroscopy systems.

Element mapping images of a symplectite microsection

Source data: JEOL (Germany) GmbH, Demoreport Uni. Vienna (JXA)

The linking of light microscopy signals and electron-optical details allows, among other things, conclusions to be drawn regarding the exact location of proteins in specific sections of tissues. JEOL manufactures intuitive, multi-system complete solutions for combining fluorescence and high-resolution electron microscopy.

Thin section of a zebra fish: correlatively superimposed electron and fluorescence microscopic images

Source data: JEOL (Germany) GmbH, Centre for Regenerative Therapies, TU Dresden.

The colours of a butterfly wing are created by pigment or structural colours. Due to the delicate surface of the wing, it is mechanically impossible to prepare a cross-section. With JEOL preparation systems and scanning electron microscopes, even fragile, organic structures can become accessible and visible.

Image of a cross-section through a butterfly wing (Morpho)

Source data: JEOL Ltd., Cross Section Polisher brochure

Many of today's material systems are being functionalised. Tailor-made properties, such as abrasion resistance, colour or chemical resistance, are achieved by forming multi-layer systems on substrates. The systems manufactured by JEOL simplify the examination of these coating systems. JEOL supplies complete solutions from artifact-free preparation to automated and reproducible extraction of relevant parameters such as layer thickness or roughness.

Coating system on a metallic substrate

Source data: JEOL (Germany) GmbH

For functionalised high-performance materials, the need for the controlled application of multi-layer systems on a substrate is becoming increasingly important. Specifically in the context of protective layers on metallic substrates, these systems make an important contribution to improving the longevity of heavily stressed components. In order to be able to image the chemical composition and the microstructural properties, JEOL has developed instruments that make it possible to prepare multi-layered components and map them to a previously unavailable depth of detail.

Layers of paint on an Al substrate

Source: JEOL (Germany) GmbH

In the electronics industry, integrated circuits and components have to be connected by wires. The failure of this interface is one of the commonest causes of failure of these components. Characterising the quality of this interface requires pinpoint-accurate cross-sectional preparation without any thermomechanical load on the wire. JEOL systems enable the quick, simple, artifact-free and pinpoint-accurate preparation and detailed characterisation of this interface.

Cross-section through the bond pad of a light emitting diode.

Source data: JEOL (Germany) GmbH

More and more frequently, innovative materials are being tailor-made to their areas of application. Such precise modifications frequently occur even down to the nanoscale. Characterising such sensitive surfaces places the highest of demands on the imaging device. The high-resolution scanning electron microscopes from JEOL routinely operate within this threshold range.

Surface image of a zeolite compound

Source: JEOL Ltd.

Modern metallic materials are frequently formed of complex systems comprising various constituents. The spatial orientation of the individual crystals (texture) and chemical composition are important components with respect to the resulting mechanical properties. In order to be able to detect both the texture and the chemical composition in parallel, JEOL supplies powerful complete solutions from artifact-free sample preparation to comprehensive three-dimensional reconstruction. This enables the direct comparison of both analytical techniques.

Mulit-layered circuit on a ceramic substrate (Al2O3, Mo, W)

Source: JEOL Ltd.

Photolithography is an essential method in semiconductor and microelectrical technology for manufacturing integrated circuits with high throughput. Electron-optical systems from JEOL enable fast, reliable quality assurance, as well as the optimisation and development of new processes in semiconductor technology.

Photolithographically structured silicon wafer

Source: JEOL (Germany) GmbH, Max-Planck-Institut für Halbleiterforschung, Munich.