Automotive, aviation and aerospace technology

Abrasives contain particles of very hard, ceramic grains. Mechanically stripping the material structure to evaluate the corn and pore distribution is therefore very challenging. JEOL systems enable the simple, artifact-free production of large-scale cross-sections for examination.

Cross-section through an abrasive material with boron nitride grains

Source data: JEOL (Germany) GmbH, Diamant-Gesellschaft Tesch GmbH, data authorised for publication

Modern paintwork is usually performed as a multi-layer system. In the case of macroscopically visible paint defects, it is very important to be able to determine the layer in which the cause of the defect lies. Our systems make it easy to examine the cross-section of the layers of paint.

Cross-section of a painted metal surface. The diameter of the inclusion is approx. 10 µm.

Source data: JEOL Ltd. / CP brochure

The surface of lotus leaves can serve as a model for self-cleaning surfaces. The exact characterisation of these surfaces is vital in order to be able to recreate them. The surface of lotus leaves comprises small wax tubes that can be easily destroyed during examination with an electron beam. JEOL therefore offers tailor-made solutions that thermally stabilise the samples in a controlled manner and thus prevent them from being destroyed by the observation.

Surface of a lotus petal. The wax tubes have a diameter of approx. 50 nm

Source data: JEOL (Germany) GmbH

Modern paintwork is usually a multi-layer system. In the case of macroscopically visible paint defects, it is very important to be able to determine the layer in which the cause of the defect lies. JEOL preparation systems enable the simple and reproducible production of artifact-free cross-sections.

Cross-section of a painted metal surface. The diameter of the inclusion is approx. 10 µm.

Source data: JEOL Ltd., CP brochure

The formation of precipitates is used systematically to define the mechanical properties of a metallic structure. However, as a form of contamination, these can also be undesired. In order to be able to judge the quality of an alloy, it is necessary to determine the morphology and chemical composition of the precipitates. This is why JEOL supplies all-round, complete solutions, from artifact-free sample preparation to high-resolution analysis from the µm to the nm level.

Element mapping image of a brass alloy

Source data: JEOL (Germany) GmbH

In industrial quality inspection, the simple and quick characterisation of a workpiece is of vital importance. Thanks to their high resolution, powerful element analysis and, above all, their unique depth of detail, scanning electron microscopes are increasingly being used for this purpose. All JEOL systems have a special lens that ensures distortion-free, detailed imaging of macroscopic components.

Electron microscope image of a 33-mm long screw

Source data: JEOL (Germany) GmbH

During operation, materials are frequently exposed to high thermal loads, which change the microstructure or chemical composition of the material. In order to be able to examine this change in a scanning electron microscope, JEOL equips its EDX detectors with the option of recording the change over time. It is therefore possible to observe in-situ e.g. the grain growth and chemical separation caused by an external heat input.

Thermally induced change to soldering tin (Pb Sn)

Source: JEOL Ltd.

Many of today's material systems are being functionalised. Tailor-made properties, such as abrasion resistance, colour or chemical resistance, are achieved by forming multi-layer systems on substrates. The systems manufactured by JEOL simplify the examination of these coating systems. JEOL supplies complete solutions from artifact-free preparation to automated and reproducible extraction of relevant parameters such as layer thickness or roughness.

Coating system on a metallic substrate

Source data: JEOL (Germany) GmbH

For functionalised high-performance materials, the need for the controlled application of multi-layer systems on a substrate is becoming increasingly important. Specifically in the context of protective layers on metallic substrates, these systems make an important contribution to improving the longevity of heavily stressed components. In order to be able to image the chemical composition and the microstructural properties, JEOL has developed instruments that make it possible to prepare multi-layered components and map them to a previously unavailable depth of detail.

Layers of paint on an Al substrate

Source: JEOL (Germany) GmbH

In the electronics industry, integrated circuits and components have to be connected by wires. The failure of this interface is one of the commonest causes of failure of these components. Characterising the quality of this interface requires pinpoint-accurate cross-sectional preparation without any thermomechanical load on the wire. JEOL systems enable the quick, simple, artifact-free and pinpoint-accurate preparation and detailed characterisation of this interface.

Cross-section through the bond pad of a light emitting diode.

Source data: JEOL (Germany) GmbH

More and more frequently, innovative materials are being tailor-made to their areas of application. Such precise modifications frequently occur even down to the nanoscale. Characterising such sensitive surfaces places the highest of demands on the imaging device. The high-resolution scanning electron microscopes from JEOL routinely operate within this threshold range.

Surface image of a zeolite compound

Source: JEOL Ltd.

Modern metallic materials are frequently formed of complex systems comprising various constituents. The spatial orientation of the individual crystals (texture) and chemical composition are important components with respect to the resulting mechanical properties. In order to be able to detect both the texture and the chemical composition in parallel, JEOL supplies powerful complete solutions from artifact-free sample preparation to comprehensive three-dimensional reconstruction. This enables the direct comparison of both analytical techniques.

Mulit-layered circuit on a ceramic substrate (Al2O3, Mo, W)

Source: JEOL Ltd.