JEOL IB-19550CCP Cross Section Polisher

The JEOL cross-section Polisher, a Ar-ion specimen preparation instrument, was first commercialized in 2003 and has become a market leader and one of JEOL’s best-selling products. With the latest version of the Cross Section Polisher IB-19550CCP, JEOL continues this successful tradition and once again sets the standard.

Thanks to an improved ion source, cross sections can now be prepared even more gently and with fewer artifacts, giving the CP significant advantages over other preparation methods — especially for delicate samples. Thanks to integrated nitrogen cooling, even the most fragile, beam-sensitive samples such as solders or biological specimens can be prepared without artifacts. With the new source, removal rates of more than 1,200 µm/h (Si) are now achievable, significantly increasing throughput. For air-sensitive samples, a transfer container is also available, allowing, for example, battery samples to be hermetically sealed after preparation and transferred into a glovebox or directly into a scanning electron microscope.

To enhance usability, both the software and the polisher’s touch display have been upgraded. Users can now remotely monitor the preparation progress via network access. The multifunctional stage supports not only the preparation of traditional cross sections but also the flat-milling of embedded sample surfaces — ideal for ultra-high-resolution investigations in scanning electron microscopy as well as for analytical applications such as EDS, WDS, and EBSD.

In addition, the IB-19550CCP enables controlled depth profiling and sputter coating of non-conductive samples.